OS GSO IEC 60749-7:2017
IEC 60749-7:2011
Omani Standard
Current Edition
·
Approved on
03 October 2017
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
OS GSO IEC 60749-7:2017 Files
English
21 Pages
Current Edition
Reference Language
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OS GSO IEC 60749-7:2017 Scope
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
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